Conference Presentation at SPIE Optics + Optoelectronics 2025:

“Compact laser-induced plasma source for advanced soft X-ray absorption spectroscopy”

Date: 06.06.2025

Our team co-authored the recent conference presentation “Compact laser-induced plasma source for advanced soft X-ray absorption spectroscopy,” presented at SPIE Optics + Optoelectronics 2025 (Prague, Czech Republic, 07-10 April 2025).

The presented system is based on a pulsed krypton gas-jet target driven by a laser to generate debris-free soft X-ray radiation in the 250–1000 eV energy range. In contrast to conventional solid targets, the gas-based approach ensures clean and stable operation, making it well-suited for repeated measurements and long-term use. An integrated high line-density flat-field grating spectrometer provides a resolving power of up to E/ΔE ≈ 1535 at 430 eV, enabling detailed multi-edge X-ray absorption analysis of thin solid and liquid samples under vacuum conditions.

By combining compact system design with high spectral performance, the demonstrated plasma source offers a practical alternative to large-scale synchrotron facilities for selected applications. The approach significantly improves accessibility to advanced soft X-ray spectroscopy and supports detailed investigations of elemental composition and electronic structure in materials science, chemistry, and related research fields.

Citation:

Jonathan Holburg, Anja Ahrens, Maik Lübbecke, Lars Sölter, Jürgen Thieme, Stephan Figul, Gerd Marowsky, Ales Charvat, Bernd Abel, Klaus Mann, and Dong-Du Mai „Compact laser-induced plasma source for advanced soft X-ray absorption spectroscopy“, Proc. SPIE PC13537, Compact Radiation Sources from EUV to Gamma-rays: Development and Applications II, PC135370J (6 June 2025); https://doi.org/10.1117/12.3056486